Simulation of the delamination of thin films

S. Scarle; C. P. Ewels; M. I. Heggie

doi:10.1140/epjb/e2005-00285-1

Simulation of the delamination of thin films

S. Scarle^*, C. P. Ewels, M. I. Heggie

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

We simulate thin film delamination using a lattice springs model. We use this model to construct a phase diagram of different delamination behaviours, produced by varying the compression of the film and also the radius to which local relaxation is allowed to take place about failing bonds. From this we see a progression from laminar and linear behaviours to radial and rounded features as compressive stress is increased. Sinusoidal telephone cord behaviour occurs only at a small range of fairly low stresses, and thin films.

Original language	English
Pages (from-to)	529-534
Number of pages	6
Journal	European Physical Journal B
Volume	46
Issue number	4
DOIs	https://doi.org/10.1140/epjb/e2005-00285-1
Publication status	Published - 7 Sept 2005
Externally published	Yes

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title = "Simulation of the delamination of thin films",

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author = "S. Scarle and Ewels, {C. P.} and Heggie, {M. I.}",

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AB - We simulate thin film delamination using a lattice springs model. We use this model to construct a phase diagram of different delamination behaviours, produced by varying the compression of the film and also the radius to which local relaxation is allowed to take place about failing bonds. From this we see a progression from laminar and linear behaviours to radial and rounded features as compressive stress is increased. Sinusoidal telephone cord behaviour occurs only at a small range of fairly low stresses, and thin films.

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Simulation of the delamination of thin films

Abstract

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