Optimum design for maximum wavelength resolution based on edge filter ratiometric system

Qiang Wu*, Ginu Rajan, Pengfei Wang, Yuliya Semenova, Gerald Farrell

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper provides an analysis of the influence of a range of factors on the resolution of the ratiometric wavelength measurement system including the slope of the edge filter, the spectral nature of the input optical signal and the working wavelength range. Our investigations show that, for a given input optical signal and when the working wavelength range is known, it is relatively straightforward to select an optimum slope for the edge filter that will yield a maximum resolution for the system.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2009 - Material and Device Technology for Sensors
DOIs
Publication statusPublished - 2009
Externally publishedYes
EventInternational Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors - Beijing, China
Duration: 17 Jun 200919 Jun 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7381
ISSN (Print)0277-786X

Conference

ConferenceInternational Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Country/TerritoryChina
CityBeijing
Period17/06/0919/06/09

Keywords

  • Edge filter
  • Ratiometric system
  • SNR

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