Modeling of 3-D Interactive Forces in Nanomanipulation

Guangyong Li; Ning Xi; Mengmeng Yu; Wai Keung Fung

doi:10.1109/IROS.2003.1249185

Modeling of 3-D Interactive Forces in Nanomanipulation

Guangyong Li^*, Ning Xi, Mengmeng Yu, Wai Keung Fung

^*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

24 Citations (Scopus)

Abstract

Previous studies on nanomanipulation using Atomic Force Microscope (AFM) go through the scan-design-manipulation-scan cycle, in which an operator does not have any real-time visual feedback during manipulation. In this paper, a simple model of tip-substrate-object interactive forces has been presented for the qualitative and quantitative analysis. Based on this model, the real-time tip-substrate-object interactive forces are used to update the AFM images in order to provide the operator with real-time visual feedback. The real-time visual display combining with real-time force feedback provides an augmented reality environment, in which the operator not only can feel the real-time 3-D interaction forces but also observe the real-time changes of the nano-environment.

Original language	English
Pages	2127-2132
Number of pages	6
DOIs	https://doi.org/10.1109/IROS.2003.1249185
Publication status	Published - Jan 2004
Externally published	Yes
Event	2003 IEEE/RSJ International Conference on Intelligent Robots and Systems - Las Vegas, NV, United States Duration: 27 Oct 2003 → 31 Oct 2003

Conference

Conference	2003 IEEE/RSJ International Conference on Intelligent Robots and Systems
Country/Territory	United States
City	Las Vegas, NV
Period	27/10/03 → 31/10/03

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10.1109/IROS.2003.1249185

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title = "Modeling of 3-D Interactive Forces in Nanomanipulation",

abstract = "Previous studies on nanomanipulation using Atomic Force Microscope (AFM) go through the scan-design-manipulation-scan cycle, in which an operator does not have any real-time visual feedback during manipulation. In this paper, a simple model of tip-substrate-object interactive forces has been presented for the qualitative and quantitative analysis. Based on this model, the real-time tip-substrate-object interactive forces are used to update the AFM images in order to provide the operator with real-time visual feedback. The real-time visual display combining with real-time force feedback provides an augmented reality environment, in which the operator not only can feel the real-time 3-D interaction forces but also observe the real-time changes of the nano-environment.",

author = "Guangyong Li and Ning Xi and Mengmeng Yu and Fung, {Wai Keung}",

year = "2004",

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doi = "10.1109/IROS.2003.1249185",

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AU - Li, Guangyong

AU - Xi, Ning

AU - Yu, Mengmeng

AU - Fung, Wai Keung

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AB - Previous studies on nanomanipulation using Atomic Force Microscope (AFM) go through the scan-design-manipulation-scan cycle, in which an operator does not have any real-time visual feedback during manipulation. In this paper, a simple model of tip-substrate-object interactive forces has been presented for the qualitative and quantitative analysis. Based on this model, the real-time tip-substrate-object interactive forces are used to update the AFM images in order to provide the operator with real-time visual feedback. The real-time visual display combining with real-time force feedback provides an augmented reality environment, in which the operator not only can feel the real-time 3-D interaction forces but also observe the real-time changes of the nano-environment.

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T2 - 2003 IEEE/RSJ International Conference on Intelligent Robots and Systems

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Modeling of 3-D Interactive Forces in Nanomanipulation

Abstract

Conference

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